Title | Defects at Ge/oxide and IIIäóñV/oxide interfaces |
Publication Type | Journal Article |
Year of Publication | 2013 |
Authors | Van de Walle C.G., Choi M., Weber J.R., Lyons J.L., Janotti A. |
Journal | Microelectronic Engineering |
Volume | 109 |
Pagination | 211 |
DOI | 10.1016/j.mee.2013.03.151 |