| Title | Defects at Ge/oxide and IIIäóñV/oxide interfaces |
| Publication Type | Journal Article |
| Year of Publication | 2013 |
| Authors | Van de Walle C.G., Choi M., Weber J.R., Lyons J.L., Janotti A. |
| Journal | Microelectronic Engineering |
| Volume | 109 |
| Pagination | 211 |
| DOI | 10.1016/j.mee.2013.03.151 |
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