Defects at Ge/oxide and IIIäóñV/oxide interfaces

TitleDefects at Ge/oxide and IIIäóñV/oxide interfaces
Publication TypeJournal Article
Year of Publication2013
AuthorsVan de Walle C.G., Choi M., Weber J.R., Lyons J.L., Janotti A.
JournalMicroelectronic Engineering
Volume109
Pagination211
DOI10.1016/j.mee.2013.03.151