Impact of native defects in high-k dielectric oxides on GaN/oxide metal–oxide–semiconductor devices

TitleImpact of native defects in high-k dielectric oxides on GaN/oxide metal–oxide–semiconductor devices
Publication TypeJournal Article
Year of Publication2013
AuthorsChoi M, Lyons JL, Janotti A, Van de Walle CG
Journalphysica status solidi (b)
Volume250
Pagination787–791