Publications

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Umezawa N.  2010.  Effects of capping HfO2 with multivalent oxides toward reducing the number of charged defects. Appl. Phys. Lett.. 96:162906.
Umezawa N, Shiraishi K.  2010.  Origin of high solubility of silicon in La2O3: A first-principles study. Appl. Phys. Lett.. 97:202906.